J. KIMS Technol Search

CLOSE


J. KIMS Technol > Volume 15(2); 2012 > Article
Journal of the Korea Institute of Military Science and Technology 2012;15(2):201-207.
DOI: https://doi.org/10.9766/KIMST.2012.15.2.201   
Characteristics of Damage on Photosensor Irradiated by Intense Illumination : Thermal Diffusion Model
Chan-Ho Kwon, Myeong-Suk Shin, Hyon-Seok Hwang, Hong-Lae Kim, Seong-Shik Kim, Min-Kyu Park
1Department of Chemistry, Kangwon National University
2
고섬광에 노출된 광센서의 손상 특성 : 열확산 모델
권찬호, 신명숙, 황현석, 김홍래, 김성식, 박민규
1강원대학교 화학과
2국방과학연구소
Abstract
Pulsed lasers at the 613 nm and 1064 nm wavelengths on nanoseconds have been utilized to characterize the damage on Si photodiode exposed to intense illumination. Morphological damages and structural changes at sites on the photodiode irradiated during microseconds of laser pulses were analyzed by FE-SEM images and XRD patterns, respectively. The removal of oxide coating, ripple, melting marks, ridges, and crater on photodiodes were definitely observed in order of increasing the pulse intensities generated above the damage threshold. Then, the degradation in photosensitivity of the Si photodiode irradiated by high power density pulses was measured as a function of laser irradiation time at the various wavelengths. The free charge carrier and thermal diffusion mechanisms could have been invoked to characterize the damage. The relative photosensitivity data calculated using the thermal diffusion model proposed in this paper have been compared with the experimental data irradiated above the damage threshold.
Key Words: Shock Wave, Intense Illumination, Energy Density Threshold, Thermal Diffusion, Photosensor, Free Charge Carrier, Photosensitivity
TOOLS
Share :
Facebook Twitter Linked In Google+ Line it
METRICS Graph View
  • 0 Crossref
  •    
  • 646 View
  • 0 Download
Related articles in J. KIMS Technol.

Characteristics of the Spray and Combustion in the Liquid Jet2002 May;5(1)



ABOUT
ARTICLE CATEGORY

Browse all articles >

BROWSE ARTICLES
FOR CONTRIBUTORS
Editorial Office
160 Bugyuseong-daero 488beon-gil, Yuseong-gu, Daejeon 34060, Korea
Tel: +82-42-823-4603    Fax: +82-42-823-4605    E-mail: kimst@kimst.or.kr                

Copyright © 2024 by The Korea Institute of Military Science and Technology.

Developed in M2PI

Close layer
prev next