Improvements in Design and Evaluation of Built-In-Test System

Heo, Wan-Ok; Park, Eun-Shim; Yoon, Jung-Hwan

doi:2012.15.2.111

J. KIMS Technol > Volume 15(2); 2012 > Article

Journal of the Korea Institute of Military Science and Technology 2012;15(2):111-120.
DOI: https://doi.org/10.9766/KIMST.2012.15.2.111

Improvements in Design and Evaluation of Built-In-Test System

Wan-Ok Heo, Eun-Shim Park, Jung-Hwan Yoon

무기체계 정비성 향상을 위한 BIT 설계 및 검증 방안

허완욱, 박은심, 윤정환

LIG넥스원(주)

Abstract

Built-In-Test is a design feature in more and more advanced weapon system. During development test and evaluation(DT&E) it is critical that the BIT system be evaluated. The BIT system is an integral part of the weapon system and subsystem. Built-In-Test assists in conducting on system and subsystem failure detection and isolation to the Line Replaceable Unit(LRU). This capability reduces the need for highly skilled personnel and special test equipment at organizational level, and reduces maintenance down-time of system by shortening Total Corrective Maintenance Time. During DT&E of weapon system the objective of BIT system evaluation is to determine BIT capabilities achieved and to identify deficiencies in the BIT system. As a result corrective actions are implemented while the system is still in development. Through the use of the reiterative BIT evaluation the BIT system design was corrected, improved, or updated, as the BIT system matured.

Key Words: Built-In-Test, Fault Detection Rate/Fraction of Faults Detectable, Fault Isolation Rate, False Alarm Rate