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Correlation between Dielectric Constant Change and Oxidation Behavior of Silicon Nitride Ceramics at Elevating Temperature up to 1,000 °C
Seok-Kin Yong, Seok-Young Ko, Wook Ki Jung, Dahye Shin, Jin-Woo Park, Jaeho Choi
J. KIMS Technol. 2022;25(6):580-585.   Published online December 5, 2022
DOI: https://doi.org/10.9766/KIMST.2022.25.6.580

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Correlation between Dielectric Constant Change and Oxidation Behavior of Silicon Nitride Ceramics at Elevating Temperature up to 1,000 °C
Journal of the Korea Institute of Military Science and Technology. 2022;25(6):580-585   Crossref logo
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Oxidation bonding of porous silicon nitride ceramics with high strength and low dielectric constant
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Interaction between creep, oxidation and microporosity in reaction-bonded silicon nitride
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Effect of pre-oxidation on the microstructure, mechanical and dielectric properties of highly porous silicon nitride ceramics
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Preparation of Low Dielectric Constant Porous Silicon Nitride Ceramics for Radome Application
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High-Temperature Oxidation Behavior of High-Purity α-, β-, and Mixed Silicon Nitride Ceramics
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Crystallization Behavior and Dielectric Properties of a New High Dielectric Constant Low-Temperature Cofired Ceramics Material Based on Nd2O3-TiO2-SiO2 Glass-Ceramics
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Oxidation Behavior of NBD 200 Silicon Nitride Ceramics
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Thermodynamic analysis of the high-temperature stability of silicon nitride and silicon carbide
Ceramics International. 1985;11(4):128   Crossref logo
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