 |
 |
Search
- Page Path
-
- HOME
- Search
- Research Papers
- Identifying Sensitive Components and Analyzing Reliability Process to Output Characteristic for an EAFD Circuit System According to Changes of Internal Component Values
- Tae Heung Lim, Gangil Byun, Seung-gyo Jang, Seungjun Back, Youngkap Son, Hosung Choo
- J. KIMS Technol. 2018;21(5):697-703.
- The Reliability-Based Probabilistic Structural Analysis for the Composite Tail Plane Structures
- Seok-Je Lee, In-Gul Kim
- J. KIMS Technol. 2012;15(1):93-100.
- Editorial Office
-
160 Bugyuseong-daero 488beon-gil, Yuseong-gu, Daejeon 34060, Korea
Tel: +82-42-823-4603 Fax: +82-42-823-4605 E-mail: kimst@kimst.or.kr
Copyright © 2024 by The Korea Institute of Military Science and Technology.
