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Seungjun Back 5 Articles
Research Papers
Identifying Sensitive Components and Analyzing Reliability Process to Output Characteristic for an EAFD Circuit System According to Changes of Internal Component Values
Tae Heung Lim, Gangil Byun, Seung-gyo Jang, Seungjun Back, Youngkap Son, Hosung Choo
J. KIMS Technol. 2018;21(5):697-703.
PDF    
Comparison of Storage Lifetimes by Variance Assumption using Accelerated Degradation Test Data
Jonggyu Kim, Seungjun Back, Youngkap Son, Sanghyun Park, Moonho Lee, Insik Kang
J. KIMS Technol. 2018;21(2):173-179.
PDF    
Storage Life Estimation of Next Infrared Flare Material
Seungjun Back, Youngkap Son, Namjin Kim, Taesoo Kwon
J. KIMS Technol. 2016;19(3):311-318.
PDF    
Storage Life Estimation of Magnesium Flare Material for 81 mm Illuminating Projectile
Seungjun Back, Youngkap Son, Sunghwan Lim, Inho Myung
J. KIMS Technol. 2015;18(3):267-274.
PDF    
Single Sample Grouping Methodology using Combining Data
Seungjun Back, Youngkap Son, Seungyoung Lee, Mahnki Ahn, Cheongsig Kim
J. KIMS Technol. 2014;17(5):611-619.
PDF    


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