Journal of the Korea Institute of Military Science and Technology

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Gangil Byun	1 Article
Research Papers Identifying Sensitive Components and Analyzing Reliability Process to Output Characteristic for an EAFD Circuit System According to Changes of Internal Component Values Tae Heung Lim, Gangil Byun, Seung-gyo Jang, Seungjun Back, Youngkap Son, Hosung Choo J. KIMS Technol. 2018;21(5):697-703. DOI: https://doi.org/10.9766/KIMST.2018.21.5.697 PDF

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